ADVANCED GAN SEMICONDUCTOR

Stable quality and outstanding performance

Epitaxial materialsExcellent technology

Excellent technology in key indicators

Comprehensive evaluation and extensive testing

Relying on the Wuhu Research Institute of Xidian University, a reliability testing platform for GaN power devices is established, which has the ability to measure all parameters of GaN epitaxial wafers and power devices and evaluate reliability in extreme environments.

Core technologies to enhance value

Possess multiple core technologies, obtain multiple authorized patents, and publish multiple public papers and high - level monographs

Self-developed, updated and iterated

Integrate the training technology team. Through the design, manufacturing, updating and iteration of the gallium nitride epitaxial wafer structure, complete the design, development, performance debugging and finalization of gallium nitride products applied to the industrial level.